AutoCAF2+ is able to measure up to 256 individual measurement sites under conditions of high humidity and temperature in accordance with IPC-TM-650 2.6.25 Test Method & IPC 9691 CAF Test Users Guide.

Conductive anodic filament (CAF) failure is copper corrosion within a printed board. It is electro-migration of the copper from Anode to Cathode between two conductors of different potential, whereas growth from Cathode to Anode is a dendrite.

A combination of bias voltage and high humidity enhance CAF failures. Electrical failure results when a filament grows between electrically isolated nets. See IPC-9691 for further information on CAF.

The NEW AutoCAF2+ was developed in conjunction with a major CAF research project conducted by the British NPL.

Key Features

• Measurements from all 256 Channels can be taken in <30 seconds
• Applied Voltage: +1V to 1250V
• Measurement Range: 10⁶ Ω to 10¹⁴ Ω
• Measurement Method: Continuous on all selected channels
• Measurement Test Intervals: Fully selectable from a minimum of 1 minute
• Capable of testing to all existing test specifications – IPC – IEC – JNC and other user specifications
• Future proofed design
• AutoCAF2+ is available with 64, 128 or 256 channel configurations
• Adaptable and flexible software operating with Windows 7, 8 &10.

The post GEN3 | AUTOCAF2+™ CONDUCTIVE ANODIC FILAMENT TESTING appeared first on ASI Technologies.

One AutoSIR2+ chassis can hold between 1 to 16 measurement cards and can monitor up to 256 x 2-point test patterns or 78 x 5-point test patterns, or 32 x 9-point test patterns at selectable intervals from minutes to days. Each channel is current limited (1 M Ω), which encourages growth of dendrites for failure analysis. The frequent monitoring capability provides a full picture of the electrochemical reactions taking place on a circuit assembly, and provides early trend analysis enabling tests to be curtailed, thus saving considerable test time and money.

 Key Features

• Measurements from all 256 Channels can be taken in <30 seconds
• Applied Voltage: +1V to 100V
• Measurement Range: 10⁶ Ω to 10¹⁴ Ω
• Measurement Method: Continuous on all selected channels
• Measurement Test Intervals: Fully selectable from minimum of 1 minute
• Capable of testing to all existing test specifications – IPC – IEC – JNC and other user specifications
• Future proofed design
• AutoSIR2+ is available with 64, 128 or 256 channel configurations
• On connection the system runs a self test
• Adaptable and flexible software operating with Windows 7, 8 &10

The post GEN3 | AUTOSIR2+ SURFACE INSULATION RESISTANCE TESTER appeared first on ASI Technologies.